MULTI 75 系列 AFM 探头主要适用于力调制模式。
| 技术数据: | ||
| Value | Range | |
| Resonant Freq. | 75 kHz | +/-15 kHz |
| Force Constant | 3 N/m | 1 - 7 N/m |
| Length | 225 µm | +/-10 µm |
| Mean Width | 28 µm | +/-5 µm |
| Thickness | 3 µm | +/-1 µm |
| Tip Height | 17 µm | +/-2 µm |
| Tip Set Back | 15 µm | +/-5 µm |
| Tip Radius | <10 nm (Multi75; Multi75Al; Multi75GD) <25nm (ElectriMulti75; Multi75GB) <60nm (MagneticMulti75) <15 nm (Multi75DLC) Also see individual probes. | |
| Half Cone Angle | 20°-25° along cantilever axis 25°-30° from side 10°-at the apex | |
| Contact Resistance | 300 ohms on platinum thin film surface | |
硅探针无涂层：Multi75-G
硅探针30nm铝涂层：Multi75Al
硅探针部分镀70nm金涂层：Multi75GD
硅探针整体镀70nm金涂层：Multi75GB
硅探针Cr/Pt涂层（5nm Cr 覆盖 25nm Pt）：ElectriMulti75-G
硅探针，尖端侧磁性涂层,探测器侧铝涂层:MagneticMulti75
硅探针，尖端侧15nm类金刚石涂层,探测器侧30nm铝涂层:Multi75DLC
